A.P. Ambler
About
A.P. Ambler has authored 18 papers that have received a total of 522 indexed citations.
This includes 6 papers in Electrical and Electronic Engineering, 6 papers in Hardware and Architecture and 5 papers in Industrial and Manufacturing Engineering. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (5 papers), VLSI and Analog Circuit Testing (5 papers) and Industrial Vision Systems and Defect Detection (3 papers). A.P. Ambler is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (5 papers), VLSI and Analog Circuit Testing (5 papers) and Industrial Vision Systems and Defect Detection (3 papers) and collaborates with scholars based in United Kingdom, United States and Germany. A.P. Ambler's co-authors include R. J. Popplestone, Harry G. Barrow, E. Trischler, Timothy Matthews and R. M. Burstall and has published in prestigious journals such as Psychological Medicine, Artificial Intelligence and IEEE Transactions on Aerospace and Electronic Systems
In The Last Decade
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