Boyang Du
About
Boyang Du has authored 27 papers that have received a total of 136 indexed citations.
This includes 26 papers in Electrical and Electronic Engineering, 23 papers in Hardware and Architecture and 3 papers in Safety, Risk, Reliability and Quality. The topics of these papers are Radiation Effects in Electronics (25 papers), VLSI and Analog Circuit Testing (15 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). Boyang Du is often cited by papers focused on Radiation Effects in Electronics (25 papers), VLSI and Analog Circuit Testing (15 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers) and collaborates with scholars based in Italy, The Netherlands and China. Boyang Du's co-authors include Luca Sterpone, M. Sonza Reorda, Josie E. Rodriguez Condia, M. Portela-García and Luis Entrena and has published in prestigious journals such as Journal of Physics D Applied Physics, IEEE Access and IEEE Transactions on Computers
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