B.T. Murray
About
B.T. Murray has authored 20 papers that have received a total of 396 indexed citations.
This includes 15 papers in Hardware and Architecture, 11 papers in Electrical and Electronic Engineering and 6 papers in Software. The topics of these papers are VLSI and Analog Circuit Testing (10 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and Radiation Effects in Electronics (6 papers). B.T. Murray is often cited by papers focused on VLSI and Analog Circuit Testing (10 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and Radiation Effects in Electronics (6 papers) and collaborates with scholars based in United States. B.T. Murray's co-authors include John P. Hayes, Krishnendu Chakrabarty, Joseph D’Ambrosio, Nagarajan Kandasamy and V. Iyengar and has published in prestigious journals such as SAE technical papers on CD-ROM/SAE technical paper series, Computer and Reliability Engineering & System Safety
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