C. Bainier
About
C. Bainier has authored 27 papers that have received a total of 704 indexed citations.
This includes 17 papers in Biomedical Engineering, 15 papers in Electrical and Electronic Engineering and 12 papers in Atomic and Molecular Physics, and Optics. The topics of these papers are Near-Field Optical Microscopy (17 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers) and Force Microscopy Techniques and Applications (6 papers). C. Bainier is often cited by papers focused on Near-Field Optical Microscopy (17 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers) and Force Microscopy Techniques and Applications (6 papers) and collaborates with scholars based in France and United States. C. Bainier's co-authors include D. Courjon, D. Charraut, M. Spajer, F. Membrey and A. Foissy and has published in prestigious journals such as The Journal of Physical Chemistry C, Journal of Colloid and Interface Science and Reports on Progress in Physics
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