C. Charton
About
C. Charton has authored 9 papers that have received a total of 606 indexed citations.
This includes 5 papers in Electrical and Electronic Engineering, 5 papers in Electronic, Optical and Magnetic Materials and 3 papers in Atomic and Molecular Physics, and Optics. The topics of these papers are Copper Interconnects and Reliability (3 papers), Surface Roughness and Optical Measurements (3 papers) and Surface and Thin Film Phenomena (2 papers). C. Charton is often cited by papers focused on Copper Interconnects and Reliability (3 papers), Surface Roughness and Optical Measurements (3 papers) and Surface and Thin Film Phenomena (2 papers) and collaborates with scholars based in Germany. C. Charton's co-authors include Matthias Fahland, Roland Thielsch, Per W. Karlsson, A. Schöll and Armin Wedel and has published in prestigious journals such as Thin Solid Films, Surface and Coatings Technology and Physical review. B, Condensed matter
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