C. Huffman

26 papers and 387 indexed citations i.

C. Huffman has authored 26 papers that have received a total of 387 indexed citations. This includes 25 papers in Electrical and Electronic Engineering, 10 papers in Electronic, Optical and Magnetic Materials and 5 papers in Materials Chemistry. The topics of these papers are Semiconductor materials and devices (24 papers), Copper Interconnects and Reliability (10 papers) and Integrated Circuits and Semiconductor Failure Analysis (9 papers). C. Huffman is often cited by papers focused on Semiconductor materials and devices (24 papers), Copper Interconnects and Reliability (10 papers) and Integrated Circuits and Semiconductor Failure Analysis (9 papers) and collaborates with scholars based in United States, Belgium and South Korea. C. Huffman's co-authors include P. Majhi, Gerald Beyer, Husam N. Alshareef, H.C. Wen and N. Heylen and has published in prestigious journals such as Journal of Applied Physics, Chemistry of Materials and ACS Applied Materials & Interfaces