C.H. Stapper

36 papers and 1.5k indexed citations i.

C.H. Stapper has authored 36 papers that have received a total of 1.5k indexed citations. This includes 31 papers in Electrical and Electronic Engineering, 22 papers in Hardware and Architecture and 12 papers in Industrial and Manufacturing Engineering. The topics of these papers are VLSI and Analog Circuit Testing (22 papers), Integrated Circuits and Semiconductor Failure Analysis (19 papers) and Industrial Vision Systems and Defect Detection (11 papers). C.H. Stapper is often cited by papers focused on VLSI and Analog Circuit Testing (22 papers), Integrated Circuits and Semiconductor Failure Analysis (19 papers) and Industrial Vision Systems and Defect Detection (11 papers) and collaborates with scholars based in United States. C.H. Stapper's co-authors include Israel Koren, V.K. Jain, J. Barth, Christopher P. Miller and A. Furman and has published in prestigious journals such as Journal of Applied Physics, Proceedings of the IEEE and IEEE Transactions on Electron Devices