Charles E. Stroud
About
Charles E. Stroud has authored 45 papers that have received a total of 435 indexed citations.
This includes 39 papers in Hardware and Architecture, 38 papers in Electrical and Electronic Engineering and 6 papers in Biomedical Engineering. The topics of these papers are VLSI and Analog Circuit Testing (37 papers), Integrated Circuits and Semiconductor Failure Analysis (27 papers) and Radiation Effects in Electronics (16 papers). Charles E. Stroud is often cited by papers focused on VLSI and Analog Circuit Testing (37 papers), Integrated Circuits and Semiconductor Failure Analysis (27 papers) and Radiation Effects in Electronics (16 papers) and collaborates with scholars based in United States and South Korea. Charles E. Stroud's co-authors include M. Abramovici, Foster Dai, Jie Qin, Fa Foster Dai and Daniel T. Milton and has published in prestigious journals such as Journal of Geophysical Research Atmospheres, The Journal of Physical Chemistry and IEEE Transactions on Industrial Electronics.
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