Charles H.‐P. Wen

50 papers and 351 indexed citations i.

Charles H.‐P. Wen has authored 50 papers that have received a total of 351 indexed citations. This includes 32 papers in Electrical and Electronic Engineering, 31 papers in Hardware and Architecture and 15 papers in Computer Networks and Communications. The topics of these papers are VLSI and Analog Circuit Testing (25 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers) and Radiation Effects in Electronics (11 papers). Charles H.‐P. Wen is often cited by papers focused on VLSI and Analog Circuit Testing (25 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers) and Radiation Effects in Electronics (11 papers) and collaborates with scholars based in Taiwan, United States and Italy. Charles H.‐P. Wen's co-authors include Li‐Chun Wang, Ryan Huang, Li-C. Wang, Kwang‐Ting Cheng and Chia‐Ling Chang and has published in prestigious journals such as IEEE Journal on Selected Areas in Communications, IEEE Access and IEEE Transactions on Vehicular Technology