Chiayu Ai
About
Chiayu Ai has authored 22 papers that have received a total of 350 indexed citations.
This includes 18 papers in Computer Vision and Pattern Recognition, 16 papers in Mechanical Engineering and 7 papers in Electrical and Electronic Engineering. The topics of these papers are Optical measurement and interference techniques (18 papers), Advanced Measurement and Metrology Techniques (16 papers) and Surface Roughness and Optical Measurements (6 papers). Chiayu Ai is often cited by papers focused on Optical measurement and interference techniques (18 papers), Advanced Measurement and Metrology Techniques (16 papers) and Surface Roughness and Optical Measurements (6 papers) and collaborates with scholars based in United States. Chiayu Ai's co-authors include James C. Wyant, John D. Downie, Yiping Xu, Robert E. Parks and Kenneth L. Smith and has published in prestigious journals such as Optical Engineering
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