Chi-Feng Wu
About
Chi-Feng Wu has authored 18 papers that have received a total of 221 indexed citations.
This includes 15 papers in Electrical and Electronic Engineering, 13 papers in Hardware and Architecture and 3 papers in Industrial and Manufacturing Engineering. The topics of these papers are VLSI and Analog Circuit Testing (13 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers) and Radiation Effects in Electronics (7 papers). Chi-Feng Wu is often cited by papers focused on VLSI and Analog Circuit Testing (13 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers) and Radiation Effects in Electronics (7 papers) and collaborates with scholars based in Taiwan and United States. Chi-Feng Wu's co-authors include Chih-Tsun Huang, Cheng‐Wen Wu, Chua‐Chin Wang, Jin-Fu Li and Shenghua Chen and has published in prestigious journals such as IEEE Journal of Solid-State Circuits, Electronics Letters and IEEE Transactions on Reliability
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