Conal E. Murray
About
Conal E. Murray has authored 105 papers that have received a total of 2.5k indexed citations.
This includes 66 papers in Electrical and Electronic Engineering, 28 papers in Materials Chemistry and 27 papers in Mechanics of Materials. The topics of these papers are Semiconductor materials and devices (27 papers), Copper Interconnects and Reliability (25 papers) and Metal and Thin Film Mechanics (20 papers). Conal E. Murray is often cited by papers focused on Semiconductor materials and devices (27 papers), Copper Interconnects and Reliability (25 papers) and Metal and Thin Film Mechanics (20 papers) and collaborates with scholars based in United States, France and Canada. Conal E. Murray's co-authors include I. C. Noyan, Martin V. Holt, Kenneth P. Rodbell, Michael S. Gordon and Jean Jordan‐Sweet and has published in prestigious journals such as Nature, Physical Review Letters and Advanced Materials.
In The Last Decade
Explore authors with similar magnitude of impact
Breakdown of academic impact, for papers by Robert R. Fraser Breakdown of academic impact, for papers by Reinhard J. Maurer Breakdown of academic impact, for papers by Lei Gong Breakdown of academic impact, for papers by Valérie Moulin Breakdown of academic impact, for papers by Wenhui Wang Breakdown of academic impact, for papers by Luc Lebeau Breakdown of academic impact, for papers by P. Chiaradia Breakdown of academic impact, for papers by David L. Neuhoff