D. Binu
About
D. Binu has authored 26 papers that have received a total of 815 indexed citations.
This includes 9 papers in Artificial Intelligence, 7 papers in Electrical and Electronic Engineering and 7 papers in Computer Vision and Pattern Recognition. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (5 papers), VLSI and Analog Circuit Testing (4 papers) and Advancements in Semiconductor Devices and Circuit Design (4 papers). D. Binu is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (5 papers), VLSI and Analog Circuit Testing (4 papers) and Advancements in Semiconductor Devices and Circuit Design (4 papers) and collaborates with scholars based in India, Oman and Nepal. D. Binu's co-authors include B. S. Kariyappa, B. R. Rajakumar, Gokul Yenduri, P. Vijaya and M. Selvi and has published in prestigious journals such as IEEE Transactions on Industrial Electronics, Expert Systems with Applications and Applied Soft Computing
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