D. V. Boychenko
About
D. V. Boychenko has authored 16 papers that have received a total of 59 indexed citations.
This includes 12 papers in Electrical and Electronic Engineering, 3 papers in Materials Chemistry and 3 papers in Computer Networks and Communications. The topics of these papers are Radiation Effects in Electronics (9 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers) and VLSI and Analog Circuit Testing (3 papers). D. V. Boychenko is often cited by papers focused on Radiation Effects in Electronics (9 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers) and VLSI and Analog Circuit Testing (3 papers) and collaborates with scholars based in Russia, India and United States. D. V. Boychenko's co-authors include Armen V. Sogoyan, A.Y. Nikiforov, Alexander Y. Nikiforov, A. I. Chumakov and Andrey V. Yanenko and has published in prestigious journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability and Russian Microelectronics
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