Daniel Weyer
About
Daniel Weyer has authored 15 papers that have received a total of 132 indexed citations.
This includes 12 papers in Electrical and Electronic Engineering, 7 papers in Hardware and Architecture and 2 papers in Biomedical Engineering. The topics of these papers are VLSI and Analog Circuit Testing (5 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers) and Radio Frequency Integrated Circuit Design (3 papers). Daniel Weyer is often cited by papers focused on VLSI and Analog Circuit Testing (5 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers) and Radio Frequency Integrated Circuit Design (3 papers) and collaborates with scholars based in United States, Saudi Arabia and South Korea. Daniel Weyer's co-authors include C. Papachristou, Francis Wolff, Michael P. Flynn, Sunmin Jang and Bhanu Pratap Singh and has published in prestigious journals such as IEEE Access, IEEE Journal of Solid-State Circuits and Microelectronics Reliability
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