Erwin Hack
About
Erwin Hack has authored 140 papers that have received a total of 1.7k indexed citations.
This includes 66 papers in Computer Vision and Pattern Recognition, 51 papers in Electrical and Electronic Engineering and 42 papers in Mechanical Engineering. The topics of these papers are Optical measurement and interference techniques (64 papers), Advanced Measurement and Metrology Techniques (38 papers) and Advanced X-ray Imaging Techniques (18 papers). Erwin Hack is often cited by papers focused on Optical measurement and interference techniques (64 papers), Advanced Measurement and Metrology Techniques (38 papers) and Advanced X-ray Imaging Techniques (18 papers) and collaborates with scholars based in Switzerland, United Kingdom and United States. Erwin Hack's co-authors include Peter Zolliker, E. A. Patterson, Pramod K. Rastogi, Jakob Heier and Frank Nüesch and has published in prestigious journals such as Advanced Materials, ACS Nano and Advanced Functional Materials
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