F. P. M. Beenker
About
F. P. M. Beenker has authored 8 papers that have received a total of 147 indexed citations.
This includes 6 papers in Electrical and Electronic Engineering, 6 papers in Hardware and Architecture and 2 papers in Software. The topics of these papers are VLSI and Analog Circuit Testing (5 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Advancements in Photolithography Techniques (2 papers). F. P. M. Beenker is often cited by papers focused on VLSI and Analog Circuit Testing (5 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Advancements in Photolithography Techniques (2 papers) and collaborates with scholars based in The Netherlands, Germany and United States. F. P. M. Beenker's co-authors include R. Dekker, L. Thijssen and J.L. van Meerbergen and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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