Feng Lu

10 papers and 158 indexed citations i.

Feng Lu has authored 10 papers that have received a total of 158 indexed citations. This includes 6 papers in Hardware and Architecture, 5 papers in Electrical and Electronic Engineering and 4 papers in Computational Theory and Mathematics. The topics of these papers are VLSI and Analog Circuit Testing (6 papers), Formal Methods in Verification (4 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers). Feng Lu is often cited by papers focused on VLSI and Analog Circuit Testing (6 papers), Formal Methods in Verification (4 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers) and collaborates with scholars based in United States and France. Feng Lu's co-authors include Kwang‐Ting Cheng, Li-C. Wang, Yung‐Chieh Lin, Bruno Rouzeyre and Giorgio Di Natale and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Advanced materials research and Journal of Electronic Testing