F.H. Baumann
About
F.H. Baumann has authored 62 papers that have received a total of 2.0k indexed citations.
This includes 39 papers in Electrical and Electronic Engineering, 21 papers in Atomic and Molecular Physics, and Optics and 14 papers in Materials Chemistry. The topics of these papers are Semiconductor materials and devices (23 papers), Copper Interconnects and Reliability (12 papers) and Integrated Circuits and Semiconductor Failure Analysis (12 papers). F.H. Baumann is often cited by papers focused on Semiconductor materials and devices (23 papers), Copper Interconnects and Reliability (12 papers) and Integrated Circuits and Semiconductor Failure Analysis (12 papers) and collaborates with scholars based in United States, Germany and France. F.H. Baumann's co-authors include A. Ourmazd, George H. Gilmer, Y. Kim, T. Dı́az de la Rubia and M. Bode and has published in prestigious journals such as Nature, Physical Review Letters and Applied Physics Letters
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