Fu-Min Yeh
About
Fu-Min Yeh has authored 8 papers that have received a total of 212 indexed citations.
This includes 4 papers in Computational Theory and Mathematics, 4 papers in Hardware and Architecture and 4 papers in Safety, Risk, Reliability and Quality. The topics of these papers are Formal Methods in Verification (4 papers), Reliability and Maintenance Optimization (4 papers) and VLSI and Analog Circuit Testing (3 papers). Fu-Min Yeh is often cited by papers focused on Formal Methods in Verification (4 papers), Reliability and Maintenance Optimization (4 papers) and VLSI and Analog Circuit Testing (3 papers) and collaborates with scholars based in Taiwan. Fu-Min Yeh's co-authors include Sy‐Yen Kuo, Shyue-Kung Lu and Ing-Yi Chen and has published in prestigious journals such as Electronics Letters, IEEE Transactions on Reliability and VLSI design
In The Last Decade
Explore authors with similar magnitude of impact
Top countries impacted by papers by Rustan Lebe Top authors papers by Nikolai Schleußner are co-authored with Top fields papers by Marciana J. Ramos are about Top authors papers by David Campbell are co-authored with Top fields papers by Bret A. Glass are about Top fields papers by Alastair Blyth are about Top fields papers by Santiago Ancapichún are about Top authors papers by Javier Calzada Prado are co-authored with