H. Y. Chang
About
H. Y. Chang has authored 13 papers that have received a total of 306 indexed citations.
This includes 10 papers in Hardware and Architecture, 9 papers in Control and Systems Engineering and 6 papers in Electrical and Electronic Engineering. The topics of these papers are VLSI and Analog Circuit Testing (9 papers), Fault Diagnosis in Complex Systems (7 papers) and Integrated Circuits and Semiconductor Failure Analysis (3 papers). H. Y. Chang is often cited by papers focused on VLSI and Analog Circuit Testing (9 papers), Fault Diagnosis in Complex Systems (7 papers) and Integrated Circuits and Semiconductor Failure Analysis (3 papers) and collaborates with scholars based in United States. H. Y. Chang's co-authors include Gernot Metze, S.G. Chappell, G. Smith and Stephen Y. H. Su and has published in prestigious journals such as Computer, IEEE Transactions on Computers and IEEE Transactions on Reliability
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