Hans G. Kerkhoff
About
Hans G. Kerkhoff has authored 70 papers that have received a total of 273 indexed citations.
This includes 63 papers in Electrical and Electronic Engineering, 45 papers in Hardware and Architecture and 14 papers in Biomedical Engineering. The topics of these papers are VLSI and Analog Circuit Testing (43 papers), Integrated Circuits and Semiconductor Failure Analysis (31 papers) and Radiation Effects in Electronics (11 papers). Hans G. Kerkhoff is often cited by papers focused on VLSI and Analog Circuit Testing (43 papers), Integrated Circuits and Semiconductor Failure Analysis (31 papers) and Radiation Effects in Electronics (11 papers) and collaborates with scholars based in The Netherlands, United States and Canada. Hans G. Kerkhoff's co-authors include Jon T. Butler, Pascal Nouet, A. Richardson and Bart Vermeulen and has published in prestigious journals such as Computer, IEEE Transactions on Instrumentation and Measurement and Physica C Superconductivity.
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