Huaguo Liang
About
Huaguo Liang has authored 123 papers that have received a total of 899 indexed citations.
This includes 92 papers in Electrical and Electronic Engineering, 63 papers in Hardware and Architecture and 30 papers in Computer Networks and Communications. The topics of these papers are VLSI and Analog Circuit Testing (38 papers), Integrated Circuits and Semiconductor Failure Analysis (35 papers) and Radiation Effects in Electronics (34 papers). Huaguo Liang is often cited by papers focused on VLSI and Analog Circuit Testing (38 papers), Integrated Circuits and Semiconductor Failure Analysis (35 papers) and Radiation Effects in Electronics (34 papers) and collaborates with scholars based in China, Japan and United States. Huaguo Liang's co-authors include Zhengfeng Huang, Tianming Ni, Aibin Yan, Maoxiang Yi and Yingchun Lu and has published in prestigious journals such as Applied Physics Letters, IEEE Access and Journal of Applied Polymer Science.
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