Hun-Hsien Chang
About
Hun-Hsien Chang has authored 7 papers that have received a total of 130 indexed citations.
This includes 7 papers in Electrical and Electronic Engineering, 1 paper in Biomedical Engineering and 1 paper in Electronic, Optical and Magnetic Materials. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (5 papers), Electrostatic Discharge in Electronics (5 papers) and Semiconductor materials and devices (4 papers). Hun-Hsien Chang is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (5 papers), Electrostatic Discharge in Electronics (5 papers) and Semiconductor materials and devices (4 papers) and collaborates with scholars based in Taiwan. Hun-Hsien Chang's co-authors include Chung‐Yu Wu, Ming‐Dou Ker, W.C. Chiou, Ming-Dou Ker and Hongen Tu and has published in prestigious journals such as IEEE Transactions on Electron Devices, IEEE Journal of Solid-State Circuits and IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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