I. Kim
About
I. Kim has authored 9 papers that have received a total of 295 indexed citations.
This includes 7 papers in Electrical and Electronic Engineering, 3 papers in Atomic and Molecular Physics, and Optics and 2 papers in Surfaces, Coatings and Films. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (2 papers), Magnetic properties of thin films (2 papers) and Copper Interconnects and Reliability (2 papers). I. Kim is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (2 papers), Magnetic properties of thin films (2 papers) and Copper Interconnects and Reliability (2 papers) and collaborates with scholars based in South Korea, United States and Japan. I. Kim's co-authors include Kurt Ronse, Alan Myers, Frieda Van Roey, Y. Kim and Masahiro Yamaguchi and has published in prestigious journals such as Thin Solid Films, IEEE Transactions on Vehicular Technology and Electronics Letters
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