Ivan Ciofi
About
Ivan Ciofi has authored 46 papers that have received a total of 475 indexed citations.
This includes 46 papers in Electrical and Electronic Engineering, 39 papers in Electronic, Optical and Magnetic Materials and 8 papers in Mechanics of Materials. The topics of these papers are Copper Interconnects and Reliability (39 papers), Semiconductor materials and devices (35 papers) and Integrated Circuits and Semiconductor Failure Analysis (9 papers). Ivan Ciofi is often cited by papers focused on Copper Interconnects and Reliability (39 papers), Semiconductor materials and devices (35 papers) and Integrated Circuits and Semiconductor Failure Analysis (9 papers) and collaborates with scholars based in Belgium, Switzerland and United States. Ivan Ciofi's co-authors include Kristof Croes, Mikhaı̈l R. Baklanov, Zsolt Tökei, Christopher J. Wilson and Kris Vanstreels and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Chemical Communications
In The Last Decade
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