J. Bömmels
About
J. Bömmels has authored 35 papers that have received a total of 633 indexed citations.
This includes 27 papers in Electrical and Electronic Engineering, 20 papers in Electronic, Optical and Magnetic Materials and 14 papers in Atomic and Molecular Physics, and Optics. The topics of these papers are Semiconductor materials and devices (21 papers), Copper Interconnects and Reliability (20 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers). J. Bömmels is often cited by papers focused on Semiconductor materials and devices (21 papers), Copper Interconnects and Reliability (20 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers) and collaborates with scholars based in Belgium, Germany and Japan. J. Bömmels's co-authors include Kristof Croes, Zs. Tőkei, H. Hotop, M.‐W. Ruf and Zsolt Tökei and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Physical Review A
In The Last Decade
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