J. F. Marchiando
About
J. F. Marchiando has authored 21 papers that have received a total of 317 indexed citations.
This includes 19 papers in Electrical and Electronic Engineering, 13 papers in Atomic and Molecular Physics, and Optics and 5 papers in Surfaces, Coatings and Films. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (13 papers), Force Microscopy Techniques and Applications (8 papers) and Semiconductor materials and devices (5 papers). J. F. Marchiando is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (13 papers), Force Microscopy Techniques and Applications (8 papers) and Semiconductor materials and devices (5 papers) and collaborates with scholars based in United States and South Korea. J. F. Marchiando's co-authors include Joseph J. Kopanski, Jeremiah R. Lowney, G. G. Hembree, John Albers and David S. Simons and has published in prestigious journals such as Journal of Applied Physics, International Journal for Numerical Methods in Engineering and IEEE Transactions on Electron Devices
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