J. Khare
About
J. Khare has authored 7 papers that have received a total of 76 indexed citations.
This includes 7 papers in Electrical and Electronic Engineering, 6 papers in Hardware and Architecture and 2 papers in Industrial and Manufacturing Engineering. The topics of these papers are VLSI and Analog Circuit Testing (6 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and VLSI and FPGA Design Techniques (2 papers). J. Khare is often cited by papers focused on VLSI and Analog Circuit Testing (6 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and VLSI and FPGA Design Techniques (2 papers) and collaborates with scholars based in United States, Germany and Sweden. J. Khare's co-authors include W. Maly, D. Schmitt‐Landsiedel, D.B.I. Feltham, Michael E. Thomas and P. K. Nag and has published in prestigious journals such as IEEE Journal of Solid-State Circuits, IEEE Transactions on Semiconductor Manufacturing and Quality and Reliability Engineering International
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