J. Savir
About
J. Savir has authored 38 papers that have received a total of 906 indexed citations.
This includes 37 papers in Hardware and Architecture, 34 papers in Electrical and Electronic Engineering and 10 papers in Control and Systems Engineering. The topics of these papers are VLSI and Analog Circuit Testing (36 papers), Integrated Circuits and Semiconductor Failure Analysis (30 papers) and Fault Diagnosis in Complex Systems (10 papers). J. Savir is often cited by papers focused on VLSI and Analog Circuit Testing (36 papers), Integrated Circuits and Semiconductor Failure Analysis (30 papers) and Fault Diagnosis in Complex Systems (10 papers) and collaborates with scholars based in United States and Japan. J. Savir's co-authors include Paul H. Bardell, W.H. McAnney, S. Patil, Zhen Guo and George Markowsky and has published in prestigious journals such as IEEE Transactions on Computers, IBM Journal of Research and Development and IEEE Transactions on Instrumentation and Measurement
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