Jiwei Li

7 papers and 1.1k indexed citations i.

Jiwei Li has authored 7 papers that have received a total of 1.1k indexed citations. This includes 4 papers in Industrial and Manufacturing Engineering, 2 papers in Electrical and Electronic Engineering and 2 papers in Computer Vision and Pattern Recognition. The topics of these papers are Industrial Vision Systems and Defect Detection (4 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers) and AI-based Problem Solving and Planning (1 paper). Jiwei Li is often cited by papers focused on Industrial Vision Systems and Defect Detection (4 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers) and AI-based Problem Solving and Planning (1 paper) and collaborates with scholars based in China, Taiwan and United States. Jiwei Li's co-authors include Katherine Shu-Min Li, Sying-Jyan Wang, Dan Jurafsky, Chuanbo Wen and Chun‐Lung Hsu and has published in prestigious journals such as IEEE Access, IEEE Transactions on Semiconductor Manufacturing and Brazilian Journal of Chemical Engineering