J.M. Burch
About
J.M. Burch has authored 33 papers that have received a total of 1.3k indexed citations.
This includes 13 papers in Computer Vision and Pattern Recognition, 9 papers in Mechanical Engineering and 7 papers in Electrical and Electronic Engineering. The topics of these papers are Optical measurement and interference techniques (13 papers), Advanced Measurement and Metrology Techniques (9 papers) and Surface Roughness and Optical Measurements (6 papers). J.M. Burch is often cited by papers focused on Optical measurement and interference techniques (13 papers), Advanced Measurement and Metrology Techniques (9 papers) and Surface Roughness and Optical Measurements (6 papers) and collaborates with scholars based in United Kingdom, United States and China. J.M. Burch's co-authors include Andrea Di Falco, C. Forno, A.E. Ennos, E. Archbold and L H Tanner and has published in prestigious journals such as Nature, ACS Nano and Applied Physics Letters
In The Last Decade
Explore authors with similar magnitude of impact
Top authors papers by Leo A. van Eykern are co-authored with Top countries impacted by papers by Shivani Rai Paliwal Top fields papers by Aðalgeir Arason are about Top authors papers by Charlene M. Mello are co-authored with Top journals papers by Sandra Croockewit are published in Top countries impacted by papers by Khushbu Patel Top journals papers by Matthias Elstner are published in Top authors papers by Françoise Grellet are co-authored with