J.M. Burch

33 papers and 1.3k indexed citations i.

J.M. Burch has authored 33 papers that have received a total of 1.3k indexed citations. This includes 13 papers in Computer Vision and Pattern Recognition, 9 papers in Mechanical Engineering and 7 papers in Electrical and Electronic Engineering. The topics of these papers are Optical measurement and interference techniques (13 papers), Advanced Measurement and Metrology Techniques (9 papers) and Surface Roughness and Optical Measurements (6 papers). J.M. Burch is often cited by papers focused on Optical measurement and interference techniques (13 papers), Advanced Measurement and Metrology Techniques (9 papers) and Surface Roughness and Optical Measurements (6 papers) and collaborates with scholars based in United Kingdom, United States and China. J.M. Burch's co-authors include Andrea Di Falco, C. Forno, A.E. Ennos, E. Archbold and L H Tanner and has published in prestigious journals such as Nature, ACS Nano and Applied Physics Letters