J.M. Soden
About
J.M. Soden has authored 39 papers that have received a total of 774 indexed citations.
This includes 37 papers in Electrical and Electronic Engineering, 23 papers in Hardware and Architecture and 4 papers in Industrial and Manufacturing Engineering. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (35 papers), VLSI and Analog Circuit Testing (22 papers) and Semiconductor materials and devices (18 papers). J.M. Soden is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (35 papers), VLSI and Analog Circuit Testing (22 papers) and Semiconductor materials and devices (18 papers) and collaborates with scholars based in United States, Spain and Singapore. J.M. Soden's co-authors include C.F. Hawkins, Richard E. Anderson, Paiboon Tangyunyong, Alan Righter and F.J. Ferguson and has published in prestigious journals such as Proceedings of the IEEE, IEEE Transactions on Industrial Electronics and IEEE Transactions on Nuclear Science
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