Joo-Hwan Lee
About
Joo-Hwan Lee has authored 39 papers that have received a total of 380 indexed citations.
This includes 9 papers in Electrical and Electronic Engineering, 8 papers in Hardware and Architecture and 4 papers in Surgery. The topics of these papers are VLSI and Analog Circuit Testing (8 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Interconnection Networks and Systems (4 papers). Joo-Hwan Lee is often cited by papers focused on VLSI and Analog Circuit Testing (8 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Interconnection Networks and Systems (4 papers) and collaborates with scholars based in South Korea, United States and China. Joo-Hwan Lee's co-authors include Kyung Soo Kim, Joo‐Heon Yoon, Sungho Kang, Jung Ho Bae and Chang Geol Lee and has published in prestigious journals such as Applied and Environmental Microbiology, Biochemical and Biophysical Research Communications and Inorganic Chemistry
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