J.P. Dekker
About
J.P. Dekker has authored 20 papers that have received a total of 1.2k indexed citations.
This includes 18 papers in Atomic and Molecular Physics, and Optics, 12 papers in Electronic, Optical and Magnetic Materials and 4 papers in Electrical and Electronic Engineering. The topics of these papers are Copper Interconnects and Reliability (12 papers), Semiconductor materials and interfaces (10 papers) and Surface and Thin Film Phenomena (9 papers). J.P. Dekker is often cited by papers focused on Copper Interconnects and Reliability (12 papers), Semiconductor materials and interfaces (10 papers) and Surface and Thin Film Phenomena (9 papers) and collaborates with scholars based in The Netherlands, Germany and United States. J.P. Dekker's co-authors include A. Lodder, J. van Ek, J. N. Huiberts, Peter Gumbsch and R. Zeller and has published in prestigious journals such as Nature, Physical Review Letters and Journal of Applied Physics
In The Last Decade
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