J.P. Teixeira
About
J.P. Teixeira has authored 48 papers that have received a total of 213 indexed citations.
This includes 35 papers in Electrical and Electronic Engineering, 26 papers in Hardware and Architecture and 8 papers in Nuclear and High Energy Physics. The topics of these papers are VLSI and Analog Circuit Testing (24 papers), Integrated Circuits and Semiconductor Failure Analysis (20 papers) and Radiation Effects in Electronics (14 papers). J.P. Teixeira is often cited by papers focused on VLSI and Analog Circuit Testing (24 papers), Integrated Circuits and Semiconductor Failure Analysis (20 papers) and Radiation Effects in Electronics (14 papers) and collaborates with scholars based in Portugal, Brazil and Mexico. J.P. Teixeira's co-authors include I.C. Teixeira, C. Leong, Marcelino Santos, F. Vargas and J. Varela and has published in prestigious journals such as IEEE Journal of Solid-State Circuits, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment and IEEE Transactions on Nuclear Science
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