Kun Yuan
About
Kun Yuan has authored 20 papers that have received a total of 362 indexed citations.
This includes 18 papers in Electrical and Electronic Engineering, 13 papers in Hardware and Architecture and 4 papers in Biomedical Engineering. The topics of these papers are Advancements in Photolithography Techniques (14 papers), VLSI and Analog Circuit Testing (13 papers) and VLSI and FPGA Design Techniques (10 papers). Kun Yuan is often cited by papers focused on Advancements in Photolithography Techniques (14 papers), VLSI and Analog Circuit Testing (13 papers) and VLSI and FPGA Design Techniques (10 papers) and collaborates with scholars based in United States, China and Hong Kong. Kun Yuan's co-authors include David Z. Pan, Minsik Cho, Bei Yu, Jae-Seok Yang and Duo Ding and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Wireless Personal Communications and ACM Transactions on Design Automation of Electronic Systems
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