Lee J. Wells
About
Lee J. Wells has authored 31 papers that have received a total of 661 indexed citations.
This includes 12 papers in Statistics, Probability and Uncertainty, 10 papers in Industrial and Manufacturing Engineering and 8 papers in Hardware and Architecture. The topics of these papers are Advanced Statistical Process Monitoring (11 papers), Physical Unclonable Functions (PUFs) and Hardware Security (8 papers) and Industrial Vision Systems and Defect Detection (7 papers). Lee J. Wells is often cited by papers focused on Advanced Statistical Process Monitoring (11 papers), Physical Unclonable Functions (PUFs) and Hardware Security (8 papers) and Industrial Vision Systems and Defect Detection (7 papers) and collaborates with scholars based in United States, Egypt and Singapore. Lee J. Wells's co-authors include Jaime A. Camelio, William H. Woodall, Fadel M. Megahed, Byeng D. Youn and Timothy Ketelaar and has published in prestigious journals such as The Journal of the Acoustical Society of America, SAE technical papers on CD-ROM/SAE technical paper series and The International Journal of Advanced Manufacturing Technology
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