M. Cailler
About
M. Cailler has authored 36 papers that have received a total of 468 indexed citations.
This includes 18 papers in Electrical and Electronic Engineering, 16 papers in Surfaces, Coatings and Films and 15 papers in Mechanics of Materials. The topics of these papers are Electron and X-Ray Spectroscopy Techniques (14 papers), Metal and Thin Film Mechanics (14 papers) and Copper Interconnects and Reliability (11 papers). M. Cailler is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (14 papers), Metal and Thin Film Mechanics (14 papers) and Copper Interconnects and Reliability (11 papers) and collaborates with scholars based in France, Canada and Belgium. M. Cailler's co-authors include J.P. Ganachaud, V.H. Tran, Cătălin Constantinescu, S. Lefrant and Peter J. Schultz and has published in prestigious journals such as Journal of Materials Science, Surface Science and Thin Solid Films
In The Last Decade
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