M. Favalli
About
M. Favalli has authored 61 papers that have received a total of 362 indexed citations.
This includes 59 papers in Hardware and Architecture, 56 papers in Electrical and Electronic Engineering and 3 papers in Artificial Intelligence. The topics of these papers are VLSI and Analog Circuit Testing (58 papers), Integrated Circuits and Semiconductor Failure Analysis (36 papers) and Radiation Effects in Electronics (32 papers). M. Favalli is often cited by papers focused on VLSI and Analog Circuit Testing (58 papers), Integrated Circuits and Semiconductor Failure Analysis (36 papers) and Radiation Effects in Electronics (32 papers) and collaborates with scholars based in Italy, United States and Spain. M. Favalli's co-authors include B. Riccò, Cecilia Metra, P. Olivo, M. Damiani and Giovanni De Micheli and has published in prestigious journals such as IEEE Journal of Solid-State Circuits, IEEE Transactions on Computers and Electronics Letters
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