M. Narihiro
About
M. Narihiro has authored 19 papers that have received a total of 231 indexed citations.
This includes 17 papers in Electrical and Electronic Engineering, 7 papers in Electronic, Optical and Magnetic Materials and 6 papers in Atomic and Molecular Physics, and Optics. The topics of these papers are Semiconductor materials and devices (12 papers), Copper Interconnects and Reliability (7 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers). M. Narihiro is often cited by papers focused on Semiconductor materials and devices (12 papers), Copper Interconnects and Reliability (7 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers) and collaborates with scholars based in Japan and United States. M. Narihiro's co-authors include N. Furutake, Y. Hayashi, Yukinori Ochiai, Fuminori Ito and S. Saito and has published in prestigious journals such as Applied Physics Letters, IEEE Transactions on Electron Devices and Japanese Journal of Applied Physics
In The Last Decade
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