Mark C. Hakey
About
Mark C. Hakey has authored 9 papers that have received a total of 277 indexed citations.
This includes 9 papers in Electrical and Electronic Engineering, 2 papers in Biomedical Engineering and 2 papers in Hardware and Architecture. The topics of these papers are Advancements in Photolithography Techniques (6 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and VLSI and Analog Circuit Testing (2 papers). Mark C. Hakey is often cited by papers focused on Advancements in Photolithography Techniques (6 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and VLSI and Analog Circuit Testing (2 papers) and collaborates with scholars based in United States and The Netherlands. Mark C. Hakey's co-authors include James R. Schwank, Paul W. Marshall, Kenneth P. Rodbell, Kenneth A. LaBel and M.R. Shaneyfelt and has published in prestigious journals such as IEEE Transactions on Nuclear Science, IBM Journal of Research and Development and Journal of Electronic Materials
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