N. Kranitis
About
N. Kranitis has authored 26 papers that have received a total of 322 indexed citations.
This includes 20 papers in Electrical and Electronic Engineering, 18 papers in Hardware and Architecture and 6 papers in Computer Vision and Pattern Recognition. The topics of these papers are VLSI and Analog Circuit Testing (18 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers) and Radiation Effects in Electronics (12 papers). N. Kranitis is often cited by papers focused on VLSI and Analog Circuit Testing (18 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers) and Radiation Effects in Electronics (12 papers) and collaborates with scholars based in Greece and The Netherlands. N. Kranitis's co-authors include A. Paschalis, Dimitris Gizopoulos, Y. Zorian, Mihalis Psarakis and Ioannis Voyiatzis and has published in prestigious journals such as IEEE Transactions on Computers, IEEE Transactions on Aerospace and Electronic Systems and IEEE Transactions on Reliability
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