Nur A. Touba
About
Nur A. Touba has authored 93 papers that have received a total of 1.6k indexed citations.
This includes 90 papers in Electrical and Electronic Engineering, 88 papers in Hardware and Architecture and 22 papers in Control and Systems Engineering. The topics of these papers are VLSI and Analog Circuit Testing (85 papers), Integrated Circuits and Semiconductor Failure Analysis (61 papers) and Radiation Effects in Electronics (31 papers). Nur A. Touba is often cited by papers focused on VLSI and Analog Circuit Testing (85 papers), Integrated Circuits and Semiconductor Failure Analysis (61 papers) and Radiation Effects in Electronics (31 papers) and collaborates with scholars based in United States, South Korea and Spain. Nur A. Touba's co-authors include Abhijit Jas, E.J. McCluskey, C. Vamsi Krishna, B. Pouya and Kartik Mohanram and has published in prestigious journals such as IEEE Transactions on Computers, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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