Osei Poku
About
Osei Poku has authored 6 papers that have received a total of 43 indexed citations.
This includes 6 papers in Electrical and Electronic Engineering, 6 papers in Hardware and Architecture and 0 papers in Industrial relations. The topics of these papers are VLSI and Analog Circuit Testing (6 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers) and Advancements in Photolithography Techniques (3 papers). Osei Poku is often cited by papers focused on VLSI and Analog Circuit Testing (6 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers) and Advancements in Photolithography Techniques (3 papers) and collaborates with scholars based in United States. Osei Poku's co-authors include R.D. Blanton, P. Nigh, Yang Xue, Xin Li and Peter Lloyd and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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