P. Boulenc

12 papers and 353 indexed citations i.

P. Boulenc has authored 12 papers that have received a total of 353 indexed citations. This includes 10 papers in Electrical and Electronic Engineering, 4 papers in Atomic and Molecular Physics, and Optics and 3 papers in Instrumentation. The topics of these papers are Semiconductor materials and devices (5 papers), CCD and CMOS Imaging Sensors (4 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers). P. Boulenc is often cited by papers focused on Semiconductor materials and devices (5 papers), CCD and CMOS Imaging Sensors (4 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers) and collaborates with scholars based in France, Switzerland and Belgium. P. Boulenc's co-authors include C. Tavernier, F. Cristiano, V. Mortet, E. Bedel‐Pereira and M. Quillec and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Electron Device Letters