P. Jacob
About
P. Jacob has authored 9 papers that have received a total of 60 indexed citations.
This includes 7 papers in Electrical and Electronic Engineering, 3 papers in Industrial and Manufacturing Engineering and 2 papers in Biomedical Engineering. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (5 papers), Industrial Vision Systems and Defect Detection (3 papers) and Electrostatic Discharge in Electronics (3 papers). P. Jacob is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (5 papers), Industrial Vision Systems and Defect Detection (3 papers) and Electrostatic Discharge in Electronics (3 papers) and collaborates with scholars based in Switzerland and Germany. P. Jacob's co-authors include G. Nicoletti, Michael Neumann, J. Wolfrum, Markus Sauer and Kai Han and has published in prestigious journals such as Microelectronics Reliability, Biomedical Chromatography and IEEE Transactions on Device and Materials Reliability
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