Patrick Girard
About
Patrick Girard has authored 213 papers that have received a total of 1.9k indexed citations.
This includes 187 papers in Electrical and Electronic Engineering, 115 papers in Hardware and Architecture and 16 papers in Atomic and Molecular Physics, and Optics. The topics of these papers are VLSI and Analog Circuit Testing (109 papers), Integrated Circuits and Semiconductor Failure Analysis (88 papers) and Radiation Effects in Electronics (66 papers). Patrick Girard is often cited by papers focused on VLSI and Analog Circuit Testing (109 papers), Integrated Circuits and Semiconductor Failure Analysis (88 papers) and Radiation Effects in Electronics (66 papers) and collaborates with scholars based in France, Japan and China. Patrick Girard's co-authors include Xiaoqing Wen, Jie Cui, Aibin Yan, A. Virazel and Zhengfeng Huang and has published in prestigious journals such as Journal of Applied Physics, Monthly Notices of the Royal Astronomical Society and Proceedings of the IEEE
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