P.G. Ryan
About
P.G. Ryan has authored 4 papers that have received a total of 66 indexed citations.
This includes 4 papers in Electrical and Electronic Engineering, 4 papers in Hardware and Architecture and 1 paper in Industrial and Manufacturing Engineering. The topics of these papers are VLSI and Analog Circuit Testing (4 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers) and Radiation Effects in Electronics (2 papers). P.G. Ryan is often cited by papers focused on VLSI and Analog Circuit Testing (4 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers) and Radiation Effects in Electronics (2 papers) and collaborates with scholars based in United States. P.G. Ryan's co-authors include W.K. Fuchs, Subhasish Mitra, Kee Sup Kim and Irith Pomeranz and has published in prestigious journals such as IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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